High Precision Thin Film Thickness Measurement Reflectometer – Enviro Test Consrtuct

It is a compact desktop film thickness measurement system delivering high accuracy, stability, and NanoSense-grade analysis at excellent value.

SKU: ETCHPCMTG-193 Category:

Key Features

  • Highly flexible manual measurement operation
  • Standard spot size range: 0.8–1.5 mm
  • Upgradeable to a 0.2 mm spot size
  • Customizable portable carrying case for on-the-go film thickness analysis
  • Optional large-format sample stage available

Technical Specifications

Model TypeETCHPCMTG-193-AETCHPCMTG-193ETCHPCMTG-193-B
Wavelength Range190 nm – 1100 nm380 nm – 1050 nm950 nm – 1700 nm
Thickness Measurement Range¹1 nm – 40 µm15 nm – 80 µm150 nm – 250 µm
Accuracy²1 nm or 0.2%2 nm or 0.2%3 nm or 0.4%
Precision³0.02 nm0.02 nm0.1 nm
Stability⁴0.05 nm0.05 nm0.12 nm
Spot Size1.5 mm
Measurement Speed< 1 s (Single Measurement)
Light SourceHalogen + Deuterium LampHalogen LampHalogen Lamp
Sample SizeDiameter from 1 mm to 300 mm or larger
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